Keithley 4200 SCS Parametric Analyzer

The Keithley 4200 Semiconductor Characterization System is a parametric analyzer with a Windows XP based software environment which provides for measurement of DC I-V, C-V, and pulse characterization and stress-measurement/reliability testing of semiconductor devices and test structures. This instrument is equipped with a Capacitance Voltage Unit capable of nanoFarad (nF) level measurements at frequencies from 10kHz to 10MHz and also two Source-Measure Units with 1A/20W capability. Two Remote PreAmps extend the resolution of both SMUs from 100fA to 0.1fA.  Extensive application notes, white papers, and test libraries are available on the Keithley website: (http://www.keithley.com/products/semiconductor/?mn=4200-SCS ).

This instrument can be connected to the Wentworth MP2300 Wafer Prober.